HAXPES measurements of GaAs thin film//ITO interfaces for GaAs//ITO/Si junctions.Tomoya Hara,Jianbo Liang,Kenji Araki,Takefumi Kamioka,Hassanet Sodabanlu,Kentaro Watanabe,Masakazu Sugiyama,Naoteru ShigekawaThe Japan Society of Applied Physics(2018)引用 0|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要