Correction: Space-charge accumulation and band bending at conductive P3HT/PDIF-CN2 interfaces investigated by scanning-Kelvin probe microscopy

Journal of Materials Chemistry C(2021)

引用 2|浏览5
暂无评分
摘要
Correction for ‘Space-charge accumulation and band bending at conductive P3HT/PDIF-CN 2 interfaces investigated by scanning-Kelvin probe microscopy’ by Federico Chianese et al. , J. Mater. Chem. C , 2021, DOI: 10.1039/d1tc04840f.
更多
查看译文
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要