Correction: Space-charge accumulation and band bending at conductive P3HT/PDIF-CN2 interfaces investigated by scanning-Kelvin probe microscopy
Journal of Materials Chemistry C(2021)
摘要
Correction for ‘Space-charge accumulation and band bending at conductive P3HT/PDIF-CN 2 interfaces investigated by scanning-Kelvin probe microscopy’ by Federico Chianese et al. , J. Mater. Chem. C , 2021, DOI: 10.1039/d1tc04840f.
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