Investigation of excitation dynamics in HfO2 and SiO2 monolayers using subpicosecond pump-and-probe damage testing (Withdrawal Notice)
Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series（2020）
摘要
This presentation, originally published on 11 September 2020, was withdrawn per author request.
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关键词
hfo2,excitation dynamics,monolayers,pump-and-probe
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