Evaluation of long-term reliability of 4H-SiC(0001) CMOS ring oscillators at high temperature Kidist Moges Ayele,Takuma Kobayashi,Takuji Hosoi,Takayoshi Shimura,Keita Tachiki,Tsunenobu Kimoto,Heiji WatanabeThe Japan Society of Applied Physics(2021)引用 0|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要