Cross-Training to shared standards at the national cryoEM centers using “Merit Badges”
Christina M. Zimanyi,Edward T. Eng,Craig Yoshioka, Sean K. Mulligan,Claudia S. López,Corey W. Hecksel,Michael F. Schmid,Patrick G. Mitchell,Lydia-Marie Joubert,Peter S. Shen,Janet Iwasa,Grant J. Jensen,Fred J. Sigworth,Brenda Gonzalez,Yingjie Chen,Wen Jiang,Jiahui Dong, Xingyu Jiang, Zongcheng Chu Microscopy and Microanalysis(2021)
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