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Visualization of Defects in Nitride Semiconductors by Electron Channeling (conference Presentation)

Carol Trager-Cowan, Aeshah Alasamari, William Avis,Jochen Bruckbauer,Paul Edwards,Ben Hourahine, Albes Kotzai,Gunnar Kusch,Robert Martin, Ryan McDermott,G. Naresh-Kumar,M. Nouf-Allehiani,Elena Pascal,David Thomson, Dale Waters,Peter Parbrook,Arantxa Vilalta-Clemente,Angus Wilkinson,Ken Mingard,Aimo Winkelmann

Gallium Nitride Materials and Devices XV（2020）

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