STEM-based analysis of functional defects in ferroelectric ErMnO3Antonius T. J. van Helvoort,Aleksander Mosberg, Ursula Ludacka,Theodor S. Holstad,Donald M. Evans,Dennis MeierMicroscopy and Microanalysis(2021)引用 0|浏览2暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要