Thermal drag effect in quantum Hall circuits

We study the thermal drag between two mesoscopic quantum Hall (QH) circuits. Each circuit consists of an ohmic contact perfectly coupled to quantum Hall edge states. The drag is caused by strong capacitive coupling between ohmic contacts. The nonequilibirum conditions and the electron-electron interaction are considered by using the bosonization technique in the combination with the scattering theory or, equivalently, with the help of the Langevin equations. The thermal drag current in the passive circuit, the noise power of the corresponding heat current, and the Fano factor are calculated and analyzed for different coupling strengths.