MEASURING AND MODELING THE EFFECT OF LOW INTENSITY RADIATION ON DIGITAL CMOS ICS

Dmitry Zvyagintsev, Alena Eliseeva,Nikita Kulikov,Igor Kharitonov,Lev Sambursky

International Forum “Microelectronics – 2020” Joung Scientists Scholarship “Microelectronics – 2020” XIII International conference «Silicon – 2020» XII young scientists scholarship for silicon nanostructures and devices physics, material science, process and analysis（2020）

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