Self-Heating Characterization of $\beta$ -Ga2O3 Thin-Channel MOSFETs by Pulsed ${I}$ –${V}$ and Raman Nanothermography
Nicholas A. Blumenschein,Taylor Moule,Stefano Dalcanale,Elisha Mercado,Manikant Singh,James W. Pomeroy,Martin Kuball,Gunter Wagner,Tania Paskova,John F. Muth,Kelson D. Chabak,Neil A. Moser,Gregg H. Jessen,Eric R. Heller, Nicholas C. Miller,Andrew J. Green,Andreas Popp,Antonio Crespo,Kevin Leedy,Miles Lindquist IEEE Transactions on Electron Devices（2020）
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