Test strategy for low failure rates and status of a highly integrated readout chip for PMTs in JUNOAndré Zambanini,Christian Grewing, Pavithra Muralidharan, Ugur Yegin, Volker Christ,Michael Karagounis,Andre Kruth, Daniel Liebau, Dennis Nielinger,Nina Parkalian,Markus Robens,Christian Roth,Jochen Steinmann,Stefan van WaasenProceedings of Topical Workshop on Electronics for Particle Physics — PoS(TWEPP2018)（2019）引用 0|浏览9暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
