Understanding the Impact of Annealing on Interface and Border Traps in the Cr/HfO2/Al2O3/MoS2 SystemPeng Zhao,Andrea Padovani,Pavel Bolshakov,Ava Khosravi,Luca Larcher,Paul K. Hurley,Christopher L. Hinkle,Robert M. Wallace,Chadwin D. YoungACS Applied Electronic Materials(2019)引用 12|浏览6暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要