19‐3: Examination in Application of TOF‐SIMS with MS/MS to a Degradation Analysis of OLED

Daichi Shirakura,Aki Suzuki, Shinji Okamura, Takeshi Akiyama, Takahiro Shibamori,Takashi Miyamoto,Junichiro Sameshima

SID Symposium Digest of Technical Papers（2019）

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摘要

TOF‐SIMS with MS/MS was applied to degradation analyses of OLEDs. Photoluminescence and GCIB‐TOF‐SIMS revealed a degraded layer and molecular weights of degradation products. MS/MS by TOF‐SIMS gave more detailed structural information of degradation products than conventional TOF‐SIMS, which demonstrated effectiveness of TOF‐SIMS with MS/MS for degradation analyses of OLEDs.

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Surface Analysis

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