Microstructure and microwave Dielectric Properties of Sm_0.5Y_0.5VO₄ Ceramics

Sm0.5Y0.5VO4 ceramics were prepared through the solid-state reaction method. Sintering behavior and microstructure of samples were studied via scanning electron microscopy techniques, X-ray diffraction, and rietveld refinement. A purity phase with tetragonal zircon-type and dense microstructure were obtained in Sm0.5Y0.5VO4 sintered at 1225 degrees C-1325 degrees C for 4 h. The best microwave Dielectric properties of Sm0.5Y0.5VO4 ceramic with a dielectric constant similar to 10.98, a Qxf value similar to 34197 GHz, and a temperature coefficient of resonant frequency similar to-43.6 ppm/degrees C sintered at 1275 degrees C for 4 h. Sm0.5Y0.5VO4 ceramic has excellent microwave properties. If the sintering temperature can be reduced, it may be a potential candidate for microwave devices application.