Silicon Integrated Photonics Reliability

A. Mekis, G. Armijo, J. Balardeta, B. Chase, Y. Chi, A. Dahl,P. De Dobbelaere,Y. De Koninck, S. Denton, M. Eker,S. Fathpour, D. Foltz, S. Gloeckner, K.Y. Hon, S. Hovey, S. Jackson,W. Li, Y. Liang,M. Mack,G. Masini, G. McGee, S. Pang, M. Peterson, T. Pinguet, L. Planchon, K. Roberson, N. Rudnick, S. Sahni, J. Schramm, C. Sohn, K. Stechschulte,P. Sun, G. Vastola,S. Wang,G. Wong, K. Yokoyama, S. Yu., R. Zhou

Advanced Photonics 2017 (IPR, NOMA, Sensors, Networks, SPPCom, PS)（2017）

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摘要

We assess the reliability of a complete silicon integrated photonics platform through a suite of reliability assurance and qualification tests. We demonstrate high reliability of each component of the silicon photonics optical transceiver.

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silicon,reliability

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