Strain relaxation defects in Ge crystals grown on Si pillarsYadira Arroyo Rojas Dasilva,Marta D. Rossell,Rolf Erni,Fabio Isa,Giovanni Isella,Hans von Känel,Pierangelo GröningEuropean Microscopy Congress 2016: Proceedings(2016)引用 0|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要