HfO2/Al2O3multilayer for RRAM arrays: a technique to improve tail-bit retentionXueyao Huang,Huaqiang Wu, Bin Gao,Deepak C Sekar,Lingjun Dai,Mark Kellam,Gary Bronner,Ning Deng,He QianNanotechnology(2016)引用 40|浏览0暂无评分AI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要