Patent Quality and Risk Aversion Among Repeat Patent LitigantsJohn R. Allison,Mark A. Lemley, J. H. WalkerSSRN Electronic Journal(2010)引用 2|浏览0暂无评分关键词Patent Analysis,Patent CitationsAI 理解论文溯源树样例生成溯源树,研究论文发展脉络Chat Paper正在生成论文摘要