Mechanisms of retention loss in Ge<inf>2</inf>Sb<inf>2</inf>Te<inf>5</inf>-based Phase-Change Memory Y.H. Shih,J.Y. Wu,B. Rajendran, M.H. Lee, R. Cheek, M. Lamorey, M. Breitwisch, Y. Zhu, E. K. Lai,C.F. Chen, E. Stinzianni, A. Schrott,E. Joseph, R. Dasaka, S. Raoux, H.L. Lung, C. Lam2008 IEEE International Electron Devices Meeting（2008）引用 0|浏览1暂无评分AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
