Accelerate SAT-based ATPG via Preprocessing and New Conflict Management Heuristics

Junhua Huang,Hui-Ling Zhen,Naixing Wang,Mingxuan Yuan,Hui Mao,Yu Huang,Jiping Tao

2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC)（2022）

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摘要

Due to the continuous advancement of semicon-ductor technologies, there are more defects than ever widely distributed in manufactured chips. In order to meet the high product quality and low defective-parts-per-million (DPPM) goals, Boolean Satisfiability (SAT) technique has been shown to be a robust alternative to conventional APTG techniques, especially for hard-to-detect faults. However, the SA...

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关键词

Runtime,Databases,Transforms,Product design,Topology,Quality assessment,Circuit faults

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