Impact of Dynamic Voltage Scaling on SEU Sensitivity of COTS Bulk SRAMs and A-LPSRAMs Against Proton Radiation

Mohammadreza Rezaei,Guillaume Hubert,Pedro Martín-Holgado,Yolanda Morilla,Juan Carlos Fabero,Hortensia Mecha,Francisco J. Franco,Helmut Puchner,Juan A. Clemente

IEEE Transactions on Nuclear Science（2022）

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摘要

In the aerospace industry, commercial-off-the-shelf (COTS) static random access memories (SRAMs) are a cost-effective solution for obtaining high performance at the system level, which is difficult to obtain using space-qualified components. In addition, the usage of dynamic voltage scaling (DVS) is commonly used in space environments, where low power consumption is a critical issue. This article ...

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关键词

Voltage control,Protons,Sensitivity,Radiation effects,Single event upsets,Neutrons,Microcontrollers

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