Impacts of Pulsing Schemes on the Endurance of Ferroelectric Metal–Ferroelectric–Insulator–Semiconductor Capacitors

IEEE Journal of the Electron Devices Society(2022)

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摘要
In this work, the impacts of various pulsing schemes on endurance are comprehensively investigated. Trapezoidal and triangular waveforms are considered in endurance cycling tests. For endurance cycling with the trapezoidal waveforms, different rising time (Tr)/falling time (Tf), e.g., 0.05– $5 \mu \text{s}$ 更多
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关键词
Switches,Capacitors,Reliability,Silicon,Hafnium oxide,Frequency measurement,Electron traps
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