In Situ Aging-Aware Error Monitoring Scheme for IMPLY-Based Memristive Computing-in-Memory Systems
IEEE Transactions on Circuits and Systems Part 1 Regular Papers（2021）
Key words
Memristors,Monitoring,Threshold voltage,Reliability,Logic gates,Degradation,Programming,Material implication (IMPLY) logic,memristor,in-situ error monitoring and detection,aging-induced degradation,computing-in-memory,logic-in-memory,edge computing
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