On Modeling CMOS Library Cells for Cell Internal Fault Test Pattern Generation

As the manufactural technologies are moving to deep sub-micron process, the defects inside the design library cells occur more often during manufacture. Cell-Aware Testing (CAT) had been proposed to improve the test quality on detecting the cell internal defects. In CAT, the analog simulator is used to simulate the cell input combinations exhaustively for every defect to identify all the cell inpu...