Uncertainty Quantification of Printed Microwave Interconnects by Use of the Sparse Polynomial Chaos Expansion Method
IEEE Microwave and Wireless Components Letters(2022)
摘要
The performance of printed RF interconnect structures for microwave applications is highly dependent on their geometric characteristics as well as manufactured pattern fabrication errors/variations, that can only be insufficiently modeled by current simulation techniques. Here, for the first time, the response of such systems is accurately investigated when random fabrication errors are introduced...
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关键词
Uncertainty,Integrated circuit interconnections,Microwave theory and techniques,Radio frequency,Microwave integrated circuits,Microwave circuits,Microwave FET integrated circuits
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