Bits Mapping in Triple-level-cell (TLC) Charge-trap (CT) 3D NAND Flash Memory and its Applications to IoT Security

Yifang Xi,Xiaotong Fang,Yachen Kong,Yifan Guo,Hongzhe Lin,Xuepeng Zhan,Jiezhi Chen

2021 IEEE International Conference on Integrated Circuits, Technologies and Applications (ICTA)（2021）

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摘要

Error bits distributions in Triple-level-cell (TLC) charge-trap (CT) 3D NAND flash memory chips are studied systematically in this work. It is found that, firstly, hard error bits exist without dependences on the data patterns; secondly, soft error bits can be observed when programming a certain data pattern, and the distributions are unique in each block; thirdly, random errors can be distinguish...

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关键词

Integrated circuit technology,Three-dimensional displays,Data security,Conferences,Memory management,Fingerprint recognition,Programming

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