TLP Generator Setup for Reliable Switching Characterization of Commercial GaN HEMTs

Carlos Bernal,Manuel Jimenez,Fabio Andrade

2021 IEEE 22nd Latin American Test Symposium (LATS)（2021）

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摘要

This paper proposes an automated setup to reliably characterize the soft switching behavior of commercial GaN HEMTs under pulsed measurements, based on the Transmission Line Pulse (TLP) generator principle. The proposed setup allows for high voltage - high current measurements while keeping the device under test within safe thermal conditions. Additionally, the setup follows the guidelines outline...

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关键词

Current measurement,Soft switching,HEMTs,Logic gates,Transmission line measurements,Generators,Reliability

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