Precise digital integration of fast analogue signals using a 12-bit oscilloscope

An accurate laboratory characterization of beam intensity monitors requires a reliable integration of analogue signals simulating beam pulses. This poses particular difficulties when a high integration resolution is necessary for short pulses. However, the recent availability of fast 12-bit oscilloscopes now makes it possible to perform precise digital integration of nanosecond pulses using such instruments. This paper describes the methods and results of laboratory charge measurements performed at CERN using a 12-bit oscilloscope with 1 GHz analogue bandwidth and 2.5 GS/s sampling.