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Assessing the Information Content of a Non-Destructive Testing CMOS Imaging Detector

Dionysios Linardatos,Vaia Koukou,Niki Martini,Anastasios Konstantinidis,Athanasios Bakas,George Fountos,Ioannis Valais,Christos Michail

Procedia Structural Integrity（2021）

Cited 1|Views0
Key words
CMOS APS,Gd2O2S:Tb,Non-destructive testing,Scintillators,IEC 62220-1-1:2015,DQE,NEQ,Information Capacity
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