Characterizing Corruptibility of Logic Locks using ATPG

2021 IEEE International Test Conference (ITC)(2021)

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摘要
The outsourcing of portions of the integrated circuit design chain, mainly fabrication, to untrusted parties has led to an increasing concern regarding the security of fabricated ICs. To mitigate these concerns a number of approaches have been developed, including logic locking. The development of different logic locking methods has influenced research looking at different security evaluations, ty...
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关键词
logic locking,hardware security metrics,corruptibility
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