On-line Functional Testing of Memristor-mapped Deep Neural Networks using Backdoored Checksums

2021 IEEE International Test Conference (ITC)(2021)

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摘要
Deep learning (DL) applications are becoming in- creasingly ubiquitous. However, recent research has highlighted a number of reliability concerns associated with deep neural networks (DNNs) used for DL. In particular, hardware-level reliability of DNNs is of concern when DL models are mapped to specialized neuromorphic hardware such as memristor-based crossbars. Faults in the crossbars can deviate...
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