Testability-Aware Low Power Controller Design with Evolutionary Learning

2021 IEEE International Test Conference (ITC)(2021)

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摘要
XORNet-based low power controller is a popular technique to reduce circuit transitions in scan-based testing. However, existing solutions construct the XORNet evenly for scan chain control, and it may result in sub-optimal solutions without any design guidance. In this paper, we propose a novel testability-aware low power controller with evolutionary learning. The XORNet generated from the propose...
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关键词
Low Power Controller,Genetic Algorithm
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