Efficient Fault-Criticality Analysis for AI Accelerators using a Neural Twin ∗

2021 IEEE International Test Conference (ITC)(2021)

引用 7|浏览3
暂无评分
摘要
Owing to the inherent fault tolerance of deep neural network (DNN) models used for classification, many structural faults in the processing elements (PEs) of a systolic array-based AI accelerator are functionally benign. Brute-force fault simulation for determining fault criticality is computationally expensive due to many potential fault sites in the accelerator array and the dependence of critic...
更多
查看译文
AI 理解论文
溯源树
样例
生成溯源树,研究论文发展脉络
Chat Paper
正在生成论文摘要