Modification mechanism of collaborative ions implanted into 4H-SiC by atomic simulation and experiment

International Journal of Mechanical Sciences(2021)

引用 12|浏览12
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摘要
•Establish a model for SiC modification with collaborative implantation of Cu2+ and H+.•Collaborative implantation significantly increases the projection range of H+.•Residual stress induced in the model is reduced by high temperature annealing.•Quantitative comparison of damage depth between MD simulations and experiments.
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关键词
Molecular dynamics simulation,Ion implantation,Projection range,Subsurface damage,Residual stress
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