Pitfalls for transient response analysis with VF-TLP
Microelectronics Reliability(2021)
摘要
Analyzing transient ESD device behavior with TLP equipment requires more attention for implementation and measurement details than the classical quasi-static TLP approach. Minimizing hardware parasitics reduces the de-embedding effort and optimizes the quality of the voltage and current measurements. We explore different methods and hardware options and highlight potential pitfalls.
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关键词
ESD,VF-TLP,TLP,Transient response
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