Design Techniques Used To Minimize Impact Of Seu'S Targeting Microsemi Fpga'S At The Nif Target Chamber

The National Ignition Facility's (NIF) high-yield DT shots create a harsh radiation environment that can cause electronics to malfunction. This paper documents various design tradeoffs and techniques used for a Microsemi FPGA to reduce the impact of Single Event Upsets (SEUs) that enable a camera to capture images in the NIF target chamber during a high-yield shot.