Spatial resolution measurement of near-field probe by using two adjacent microstrip lines

2019 12th International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)(2019)

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摘要
In this paper, an experiment to distinguish the spatial resolution of different magnetic probes is executed. Different from traditional measuring method of spatial resolution by using one microstrip line, we measured the spatial resolution by changing two adjacent microstrip lines with space distances from 3 mm to 0.6 mm. By analyzing the test results, we can distinguish the spatial resolution of different probes.
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关键词
Spatial resolution,Magnetic field probe,Near-field scanning,Two adjacent microstrip line
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