Muon Metrology And Positioning: The Pomme Experiment

JOURNAL OF INSTRUMENTATION(2021)

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摘要
A muon metrology experiment is presented: two distant muon detection systems are used in coincidence to detect these particles originating from primary cosmic rays. The excellent spatial resolution of the Micromegas detectors allows for a precise relative positioning of the two instruments. The current setup can be used to monitor mid-or long-term deformations of a structure down to sub-millimeter resolution. It could also be employed to roughly position a distant structure with single muon detection, a typical example being an underground cavity whose position with respect to the surface is poorly known.
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关键词
Micropattern gaseous detectors (MSGC, GEM, THGEM, RETHGEM, MHSP, MI-CROPIC, MICROMEGAS, InGrid, etc), Particle tracking detectors (Gaseous detectors), Data processing methods, Detector alignment and calibration methods (lasers, sources, particle-beams)
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