Element profiling of thirty genotypes of yam bean in eastern India by using proton induced X-ray emission (PIXE)

Kalidas Pati,Shashikanta Behera,Dinesh Kumar Ray,Priya Ranjan Behera,Ananta Sarkar,V. B. S. Chauhan,V. V. Bansode,M. Nedunchezhiyan

Journal of Food Composition and Analysis（2021）

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摘要

•Element profiling of 30 genotypes of underutilized crop yam bean by PIXE technique.•A total 12 elements like P, S, K, Ca, Fe, Zn, Mn, Ni, Cu, Ti, Rb and Sr were analysed.•Mineral element rich genotypes are YBBL-20, YBBL-2, YBBL-15, EC100549, EC100551 and EC100567.•This study could be useful to develop nutrient-rich varieties of yam bean.•Finding of this study helps in combating malnutrition in developing countries.

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关键词

PIXE,MgKg−1,AMSL,NIST,CRM,MCA,PCA,ICAR-CTCRI,ICMR,US-EPA

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