Rigorous Coupled Wave Analysis Of Gaas Thermophotovoltaic Devices With A Patterned Dielectric Back Contact

Madhan K. Arulanandam,Jeronimo Buencuerpo,Myles A. Steiner,Eric J. Tervo,Leah Y. Kuritzky,Emmett E. Perl,Brendan M. Kayes,Justin A. Briggs,Richard R. King

2021 IEEE 48TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)（2021）

引用 2|浏览11

暂无评分

摘要

In principle, a patterned dielectric back contact structure in a GaAs thermophotovoltaic device boosts the sub-bandgap reflectance. Rigorous coupled wave analysis method is used to study the three dimensional (3D) periodic grating effects of metal point contact diameter and spacing on sub-bandgap reflectance of the device.

查看译文

关键词

GaAs, thermophotovoltaics, efficiency, rigorous coupled wave analysis, patterned dielectric back contact, diffraction grating, sub-bandgap spectrum

AI 理解论文

溯源树

样例

生成溯源树，研究论文发展脉络

Chat Paper

正在生成论文摘要