Single-event-effect propagation investigation on nanoscale system on chip by applying heavy-ion microbeam and event tree analysis

The propagation of single-event effects (SEEs) on a Xilinx Zynq-7000 system on chip (SoC) was investigated using heavy-ion microbeam radiation. The irradiation results reveal several functional blocks’ sensitivity locations and cross sections, for instance, the arithmetic logic unit, register, D-cache, and peripheral, while irradiating the on-chip memory (OCM) region. Moreover, event tree analysis was executed based on the obtained microbeam irradiation results. This study quantitatively assesses the probabilities of SEE propagation from the OCM to other blocks in the SoC.