A 36 Wcwalgan/Gan-Power Hemt Using Surface-Charge-Controlled Structure

2002 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST, VOLS 1-3(2002)

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摘要
We describe high power 36 W CW operation a, 30 V using AlGaN/GaN HEMTs on SIC. Surface-charge-controlled structure, consisting of n-type doped thin GaN cap layer on AlGaN/GaN HEMT structure, is used to obtain high gate-drain breakdown voltage and to reduce current collapse. By optimizing threshold voltage of this structure, we obtained a maximum drain current of 1A/mm and a gate-drain breakdown voltage over 200 V. A 24-mm-wide-gate chip showed output power of 45.6 dBm (36 W) at 2.2 GHz with a liner gain of 9.7 dB.
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