Study and reduction of variability in 28 nm FDSOI technology

2015 International Workshop on CMOS Variability (VARI)(2015)

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摘要
This In this paper, we present a new inverter topology in order to decrease the process variability influence on performances of a ring oscillator. Using FDSOI technology, we used the back-gate electrode of the transistor to symmetrize the output of a complementary inverter. This technique will reduce the variability of the inverter and the jitter (i.e. the phase noise) of the ring oscillator. Complementary cells allow us to implement back-gate auto-biasing feedback without adding transistors and to realize a quadrature ring oscillator with an even number of inverters.
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关键词
FDSOI,Variability,Back-gate,Auto-biasing,Complementary symmetric gate
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