Quantitative Evaluation of Hard X-ray Damage to Biological Samples Using EUV PtychographyPeter Baksh,Michal Odstrcil,Aaron Parsons, Jo Bailey,Katrin Deinhardt,John E. Chad,William S. Brocklesby,Jeremy G. FreyX-RAY MICROSCOPY CONFERENCE 2016 (XRM 2016)（2017）引用 3|浏览25AI 理解论文溯源树样例生成溯源树，研究论文发展脉络Chat Paper正在生成论文摘要
