In-Situ Micro And Nano Mechanical Investigations Of Compressed Beech Wood Using Scanning Electron Microscope With Focused Ion Beam
8TH HARDWOOD CONFERENCE WITH SPECIAL FOCUS ON NEW ASPECTS ON HARDWOOD UTILIZATION - FROM SCIENCE TO TECHNOLOGY（2018）
Key words
Beech, Scanning Electron Microscopy, Focused Ion Beam, Nano indentation, Micro pillar preparation
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