Systematic Study of Grounded N-Well Latchup in 55nm Technology

Alwyn Rebello, Naveen Prasath Vellingiri,Kyong Jin Hwang,Robert Gauthier

2021 43rd Annual EOS/ESD Symposium (EOS/ESD)（2021）

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摘要

Latchup behavior in parasitic SCR detector structures with grounded N-Well (GNW) were studied, wherein GNW implies N-Wells biased at 0 V. The impact of design parameters such as injector to detector spacing, GNW to nearby Nwell (of a PMOS) distance, and guard ring combinations on latchup robustness are discussed.

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关键词

Structural rings,Industries,Systematics,Capacitors,Detectors,Robustness,Product design

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