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On the Use of Multilayer Laue Lenses with X-ray Free Electron Lasers

Mauro Prasciolu,Kevin T. Murray,Nikolay Ivanov,Holger Fleckenstein,Martin Domaracky,Luca Gelisio,Fabian Trost,Kartik Ayyer,Dietrich Krebs,Steve Aplin,Salah Awel,Ulrike Boesenberg,Grega Belsak,Anton Barty,Armando D. Estillore,Matthias Fuchs,Yaroslav Gevorkov,Joerg Hallmann,Chan Kim,Juraj Knoska,Jochen Kuepper,Chufeng Li, Wei Lu,Valerio Mariani,Andrew J. Morgan,Johannes Moeller,Anders Madsen,Dominik Oberthuer,Gisel E. Pena Murillo,David A. Reis,Markus Scholz,Bozidar Sarler,Pablo Villanueva-Perez,Oleksandr Yefanov,Kara A. Zielinski,Alexey Zozulya,Henry N. Chapman,Sasa Bajt

INTERNATIONAL CONFERENCE ON X-RAY LASERS 2020（2021）

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关键词
x-rays,multilayer Laue lenses,XFEL,optics
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