The Formation of Cn-Sn IMC Interconnection by Solid-Liquid Interdiffusion Bonding for 3D Glass Wafer Stacking
2021 22nd International Conference on Electronic Packaging Technology (ICEPT)(2021)
摘要
Wafer bonding technology promotes 3D system integration and packaing. In this paper, the Cu/Sn low-temperature bonding for 3D glass wafer stacking is studied. The effects of temperature, pressure and time on the bonding process are demonstrated by experiments and simulations. The formation of ${\text{Cu}_{3}\text{Sn}}$ is incorporated into Cu/Sn bonding interface. For 5G devices, such a...
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关键词
3D Packaging,multilayer stacked,Cu/Sn bonding,Through Glass Vias(TGVs)
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