Scalable Multitasking Dynamic Pulse Based Reliability Stress Test for High Voltage Discrete Semiconductors
2021 23rd European Conference on Power Electronics and Applications (EPE'21 ECCE Europe)(2021)
摘要
High voltage power electronic devices undergo various stressors in their application environment, leading to long-term degradation and final catastrophic failure. This accumulated damage needs to be investigated during the development phase, as well as its impact on the device long-term performance. Therefore, power semiconductors should be subjected to repetitive stress testing in order to study ...
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关键词
Performance evaluation,Europe,High-voltage techniques,Voltage,Robustness,Power electronics,Integrated circuit reliability
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