A 16-kb 9T Ultralow-Voltage SRAM With Column-Based Split Cell-VSS, Data-Aware Write-Assist, and Enhanced Read Sensing Margin in 28-nm FDSOI

IEEE Transactions on Very Large Scale Integration (VLSI) Systems(2021)

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摘要
This work proposes an static random access memory (SRAM) with column-based split cell-VSS (CS-CVSS), data-aware write-assist (DAWA), and enhanced read sensing margin in 28-nm FDSOI technology. The proposed CS-CVSS and DAWA techniques improve both half-selected (HS) static noise margin (SNM) and write margin. They also improve HS dynamic noise margin (HS-DNM) by leveraging write through virtual gro...
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关键词
Computer architecture,Microprocessors,Sensors,Thermal stability,SRAM cells,MOS devices,Layout
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